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12MP 25MP 65MP CMOS 10GigE Inspection Vision Camera for Semiconductor wafers inspection aberration electron microscopy 1 x standard Date Cable(Optional

SKU 91467124096
4.2
USD1200.00 USD1246.00

Pay in 4 interest-free payments of $300.00 Learn more

Shipping Estimate
USA
  • USA
  • CAN

Ships within 48 hours · Estimated delivery Aug 21 - Aug 26

Description

1 x standard Date Cable(Optional inquire length

Lens Mount:6mm EFL(M10)/8

Frame Rate:68 fps

this illumination system delivers stable and consistent lighting performance for demanding surface inspection tasks

12MP 25MP 65MP CMOS 10GigE Inspection Vision Camera for Semiconductor wafers inspection aberration electron microscopy 1 x standard Date Cable(OptionalMain Features Resolution from 12MP to 65MP for various applications. Adopts 10GigE interface, compatible with GigE and max. transmission distance of 100 meters without relay Compatible with GigE Vision Protocol, GenlCam Standard Support WindowsLinux Up to 1 GB local memory for burst transmission and retransmission Applications Defect Detection Surface Patch Detection Visual Positioning Size Measuring QR Code Reading VR AR Specification Model Mars12MS

Exchange/Return Notes
  • We offer a 30-day return/exchange service after receiving.
  • Final sale items are not eligible for returns or exchanges.
  • To process your return/exchange, please contact us at [email protected]
  • Please click here for more details>>> Return & Exchange Policy

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