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semiconductor analysis
14-bit data output with high dynamic range
The camera delivers reliable image quality
Pixel Size(μm)
4K GigE Line Scan Camera for Textile Inspection Mars4096G-L28gm-V2 Lens Options:+50mm lens semiconductor analysisProduct Description The Vision Datum Mars4096G L28gm V2 is a high performance 4K GigE line scan camera designed for textile defect inspection and high speed surface inspection applications. Based on a Gpixel line scan sensor, it delivers 4096 pixel resolution, 7m pixel size, and up to 28kHz line rate, enabling accurate detection of fine fabric defects during continuous production. With high dynamic range and low noise imaging, the camera captures
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